FEI Company

Malaysia

The FEI MLA (an acronym for Mineral Liberation Analyzer) scanning electron microscope (SEM) is an automated mineral analysis system that can identify minerals in polished sections of drill core, particulate, or lump materials, and quantify a wide range of mineral characteristics, such as mineral abundance, grain size, and liberation. Mineral texture and degree of liberation are fundamental properties of ore and drive its economic treatment, making the data gathered by the MLA SEM invaluable to geologists, mineralogists and metallurgists who engage in process optimization, mine feasibility studies, and ore characterization.

The FEI Verios scanning electron microscope (SEM) is the second generation of FEIs leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).

The Apreo scanning electron microscope's (SEM) revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. This makes the Apreo SEM the platform of choice for research on nanoparticles, catalysts, powders and nanodevices, without compromising on magnetic sample performance. The Apreo SEM benefits from the unique in-lens backscatter detection, which provides excellent materials contrast, even at tilt, short working distance, or on sensitive samples. The novel compound lens further improves contrast with energy filtering and adds charge filtering for imaging of insulating samples. The optional low vacuum mode now has a 500 Pa maximum chamber pressure for imaging even the most demanding insulators. With all these options, including the compound final lens, advanced detection and flexible sample handling, the Apreo SEM's performance and versatility will meet your research challenges for many years to come.

Single particle screening and data acquisition made easyThe Thermo Scientific Glacios Cryo Transmission Electron Microscope (Cryo-TEM) delivers a complete and affordable cryo-EM solution to a broad range of scientists. The Glacios Cryo-TEM features the same innovative automation for ease of use as found on the Thermo Scientific Krios G3i Cryo-TEM, and it bundles it into a small footprint that simplifies installation.

The FEI Quanta line includes six variable-pressure and environmental scanning electron microscopes (ESEM). All of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs. The Quanta line of scanning electron microscopes are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any scanning electron microscope (SEM) system. All the Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction. In addition, the field emission gun (FEG) systems contain a STEM detector for bright-field and dark-field sample imaging. Another variable that changes amongst the SEM systems is the size of the motorized stage (50mm, 100mm, and 150mm) and the motorized z-range (25mm, 60mm, and 65mm, respectively). The Quanta 650 and 650 FEG SEMs are each designed with a roomy chamber, enabling the analysis and navigation of large specimens.

The FEI Helios NanoLab DualBeam microscope has always combined FEI's best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. For scientists working at nanotechnology's leading edge, the Helios NanoLab DualBeam lets them push boundaries and create new possibilities for materials research. With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for STEM, and the most precise prototyping capabilities, scientists choose the Helios NanoLab DualBeam as their partner for innovating new materials and nanoscale devices that will influence future advancements.

Ultra High Resolution imaging and high throughput analytical performance. For metals researchers, academic and industrial research institutions, the FEI Teneo scanning electron microscope (SEM) provides Ultra High Resolution imaging together with the highest throughput analytical performance. A revolution in detection - the unique Trinity detection scheme delivers highest contrast on the widest range of samples for fastest imaging and easy interpretation of images. With three separate in-lens detectors operating simultaneously with the standard chamber detector, simultaneous detection from all angles can be performed, saving time, maximizing information and preventing sample contamination and damage.

The first TEM dedicated to the semiconductor industry The FEI Metrios system is the first transmission electron microscope (TEM) dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. Extensive automation of the basic TEM operation and measurement procedures minimizes requirements for specialized operator training. Its advanced automated metrology routines deliver greater precision than manual methods. The Metrios TEM is designed to provide customers with improved throughput and lower cost-per-sample than other TEMs.

The FEI Talos transmission electron microscope (TEM) is a new generation in TEM, built to deliver rapid access to 2D and 3D data so that you can concentrate on discovery. With configurations for materials research and life sciences research, the Talos TEM is a truly versatile system with many innovations that will serve your research needs for years to come.

The Quattro scanning electron microscope (SEM) is a versatile, high-performance instrument with a field emission gun (FEG) for excellent resolution and beam current stability. Three vacuum modes (high vacuum, low vacuum, and ESEM) provide the flexibility to accommodate the widest range of samples of any SEM available, including samples that are outgassing or otherwise not vacuum-compatible. Quattro offers a choice of detectors that include directional backscatter information, STEM and cathodoluminescence for tunable and real color contrast. All Quattro ESEM systems can be equipped with analytical capabilities, such as energy dispersive x-ray spectroscopy (EDS), wavelength dispersive x-ray spectroscopy (WDS) and electron backscatter diffraction (EBSD) coplanar with EDS. Quattros unique architecture is supported by a help function (User Guidance) that not only instructs, but also directly interacts with the microscope. Quattro supports undoredo functionality, scanning presets, column presets, easy camera-based navigation, SmartSCAN and drift compensated frame integration (DCFI) to boost productivity, data quality and ease of use.