Manufacturer / Exporter / Supplier Of Quattro scanning electron microscope, Aquilos Cryo-FIB system, Vion Plasma Focused Ion Beam System, Focused Ion Beam, OptiFIB Focused Ion Beam, Heating Stage, CDEM Detector, Ceta, Back-scatter Tip, Carbon Deposition, Acoustic Enclosure, Tilt Cryo-tr... Read More
Gas chemistry solution (Naphthalene) for Ion or Electron beam deposition of Carbon-based material, mounted on any of the available GIS ports.
he acoustic enclosure is a cover that fits the various pump(s) of the microscope system. It provides noise dampening of the pump(s) for operator and microscope. Check which enclosures we have available for your instrument.
The FEI Talos™ transmission electron microscope (TEM) is a new generation in TEM, built to deliver rapid access to 2D and 3D data so that you can concentrate on discovery. With configurations for materials research and life sciences research, the Talos TEM is a truly versatile system with many innovations that will serve your research needs for years to come.
The FEI MLA (an acronym for Mineral Liberation Analyzer) scanning electron microscope (SEM) is an automated mineral analysis system that can identify minerals in polished sections of drill core, particulate, or lump materials, and quantify a wide range of mineral characteristics, such as mineral abundance, grain size, and liberation. Mineral texture and degree of liberation are fundamental properties of ore and drive its economic treatment, making the data gathered by the MLA SEM invaluable to geologists, mineralogists and metallurgists who engage in process optimization, mine feasibility studies, and ore characterization.
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