FEI Company

Manufacturer / Exporter / Supplier Of Quattro scanning electron microscope, Aquilos Cryo-FIB system, Vion Plasma Focused Ion Beam System, Focused Ion Beam, OptiFIB Focused Ion Beam, Heating Stage, CDEM Detector, Ceta, Back-scatter Tip, Carbon Deposition, Acoustic Enclosure, Tilt Cryo-transfer Holder, ExSolve Wafer transmission electron microscopy, Scios analytical DualBeam system, Apreo SEM, Teneo SEM, FEI Verios scanning electron microscope, Quanta scanning electron microscopes, MLA scanning electron microscopes, Explorer 4 Analyzer, Cryo Transmission Electron Microscope, Themis TEM platform, Talos TEM, Metrios TEM, Helios NanoLab DualBeam microscope, NanoEx