Other Products / Services #130983

Circuit edit systems leading the industry in precision and throughput The FEI OptiFIB Focused Ion-Beam (FIB) circuit edit systems uses FIB technology and advanced chemistry to modify individual circuit elements. These edits are designed to validate design changes before expensive and time-consuming modifications are implemented on photomask sets. Featuring patented coaxial columns, our circuit edit systems lead the industry in precision and throughput, as well as offering the broadest range of FIB chemistries available.

The FEI ExSolve DualBeam is an automated, high-throughput sample preparation workflow for transmission electron microscopy (TEM) analysis. The ExSolve wafer TEM prep (WTP) DualBeam dramatically reduces the cost and increases the speed of sample preparation, providing semiconductor and data storage manufacturers with quick and easy access to the data they need to verify and monitor process performance. The ExSolve DualBeam can prepare site-specific TEM lamella, sampling many sites per wafer in a fully-automated process inside the fab, giving semiconductor manufacturers much more information than conventional approaches, while at the same time reducing the capital cost of sample preparation by up to 70 percent.

The FEI V400ACE Focused Ion Beam (FIB) system incorporates the latest developments in ion column design, gas delivery and end point detection to provide fast, efficient, cost-effective editing on advanced integrated circuits. Circuit editing allows product designers to reroute conductive pathways and test the modified circuits in hours, rather than the weeks or months that would be required to generate new masks and process new wafers. Fewer, shorter modification and test cycles allow manufacturers to ramp new processes to profitable high volume yields faster, and be first to market with premium priced new products.

he acoustic enclosure is a cover that fits the various pump(s) of the microscope system. It provides noise dampening of the pump(s) for operator and microscope. Check which enclosures we have available for your instrument.

The FEI Vion Plasma Focused Ion Beam System (Plasma FIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance in a single, easy-to-use instrument. By incorporating plasma ion source technology, the Vion Plasma FIB delivers increased throughput over conventional gallium FIB instruments-with speeds more than 20x faster for site-specific cross-sectioning and large area milling, as well as sample preparation. With both excellent milling precision and high-resolution imaging at low beam currents, the Vion Plasma FIB delivers the speed, accuracy and high contrast images essential for a wide range of process control, failure analysis or materials research applications.

Channel Detection Electron Multiplier (CDEM) for direct ion imaging and ion-induced secondary electron imaging. The geometry of the detector is optimized for imaging with the ion column resulting in excellent SignalNoise in ion imaging, as opposed to the Everhart Thornley SED which is optimized for SN in electron imaging.

The Centaurus detector is a retractable, scintillator-type, back-scattered electron detector.Centaurus Detector with

Gas chemistry solution (Naphthalene) for Ion or Electron beam deposition of Carbon-based material, mounted on any of the available GIS ports.

The Thermo Scientific Aquilos Cryo-FIB is the first cryo-DualBeam (focused ion beamscanning electron microscope) system dedicated to preparation of frozen, thin lamella samples from biological specimens for high-resolution tomographic imaging in a cryo-transmission electron microscope (cryo-TEM). Cryo-electron tomographys ability to visualize structures in their native context allows researchers to observe functional relationships and interactions with other components in the cellular environment. This technique promises to become an important tool for scientists seeking a better understanding of living systems at the molecular level.

The FEI NanoEx-iv is a single-tilt TEM specimen heating and biasing holder for in situ STEM imaging and elemental analysis at elevated temperatures. NanoEx-iv is the ideal solution for precise experiments in a wide range of applications that require in situ heating of nanomaterials, such as studies of nanoscale annealing behavior, phase transformations in metals, structural changes and sintering phenomena in catalyst nanosystems, quenching, segregationdiffusion phenomena, and more.

The FEI Scios DualBeam is an ultra-high-resolution analytical DualBeam system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios DualBeam is ideal for advanced research and analysis across academic, government, and industrial research environments. Advanced detection technology is at the very core of the FEI Scios DualBeam. In-lens FEI Trinity detection technology collects all signals simultaneously, saving time and offering distinctly different contrasts to capture the maximum amount of data. An innovative, under-the-lens concentric backscatter detector enhances efficiency, enabling you to select a signal based on its angular distribution to easily separate materials and topographic contrast-even at 20 eV landing energy.

The 1400 C heating stage is the total heating solution to record in-situ morphological sample changes during heating up to 1400 C.

The Thermo Scientific Explorer 4 Analyzer is a scanning electron microscope designed as an industrial microscopy solution for quality control, production process optimization, failure analysis, and profitability. Suitable for industrial production environments, the Explorer 4 Analyzer is used in demanding military, oilfield, industrial, and factory floor settings. Through scanning electron microscope (SEM) technology and EDX spectrometry, the Explorer 4 Analyzer specializes in automated particle analysis that can rapidly characterize the size, shape and elemental composition of an entire sample. By providing the power to quickly turn data into knowledge, users in an industrial space have the ability to make critical quality control decisions with confidence

The Gatan 70 tilt cryo-transfer system enables frozen suspensions or sections to be loaded into the TEM holder and transferred frost-free at temperatures below -170 C.

The Ceta 16M camera is the first camera to deliver high speed readout for simultaneous dynamic imaging and large field of view. This unique combination follows the natural workflow in TEM imaging: from fast navigation to find the area of interest-to easy optimization of the image quality via optical adjustments-to the final result: a 4k 4k image unrivaled in quality and detail.

Based on FEI's Titan STEM platform introduced in 2005 the Themis TEM family forms the next generation of the world's most powerful, commercially available suite of STEM solutions for Materials Science, with Themis Z and Themis ETEM. The FEI Themis transmission electron microscope (TEM) starts with our revolutionary wide high-tension range and corrector-ready platform, combined with a wide pole piece gap delivering the space to do more. Developed with stability and flexibility in mind, the Themis TEM high performance continuously enables atomic scale discovery and exploration. Combining these proven optics with new, breakthrough scanning transmission electron microscope (STEM) imaging capability and enhanced automation software enables ultimate imaging and analysis performance for all materials scientists.